WANG Lin, DAI Sidan. Development of A New Type of Key Parameter Panel Monitoring Device[J]. Journal of Isotopes, 2021, 34(3): 230-238. DOI: 10.7538/tws.2021.34.03.0230
Citation: WANG Lin, DAI Sidan. Development of A New Type of Key Parameter Panel Monitoring Device[J]. Journal of Isotopes, 2021, 34(3): 230-238. DOI: 10.7538/tws.2021.34.03.0230

Development of A New Type of Key Parameter Panel Monitoring Device

  • The panel monitoring device is a necessary instrument in the testing and application stage of a certain equipment. It can realize the real-time monitoring of the key parameters of the equipment. Aiming at the current situation of “old device and hindered production and maintenance”, the paper adopts new microcontroller and complex programmable logic device (CPLD) to design the hardware. The reliability of the monitoring device is improved and the volume is reduced. According to the hardware design and the characteristics of the signal to be collected, use timer interrupt and external interrupt to measure the key parameters of the software design, improve the measurement accuracy of key parameters and response frequency. And the functions of self-test and error reporting, monitoring and reset and quick configuration of model are added. Through the laboratory and field verification, the new key parameters panel monitoring device can meet the actual needs. Now, the new key parameters panel monitoring device has been successfully applied in many test sites with good effect.
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