EDXRF无标样分析未知样品含量的算法研究

The Algorithm Study on the EDXRF Analysis of Unknown Sample Content without Using Standard Samples

  • 摘要: 针对未知样品能量色散X射线荧光分析(energy dispersive X-ray fluorescence analysis, EDXRFA)方法开展无标样分析,通过测量Ti、Fe、Ni、Cu、Zn、Sr、Sn、Pb单元素标样,得到Rh靶材原级谱中Kα峰的相干与非相干散射峰强度比值R,并建立R与对应单元素标样有效原子序数的关系,得到Zeff-R的拟合曲线。求解未知样品基体时,测量未知样,得到其R,将R代入Zeff-R拟合曲线得到未知样有效原子序数,再通过基本参数法迭代计算其质量衰减系数。利用Ti、Fe、Ni、Cu、Zn、Sr、Sn、Pb单元素标样刻度仪器获取Gi参数,求解未知样品基体时用于相应元素的基本参数迭代。为验证算法可靠性,采用本算法分析15个国家土壤标准样品,结果表明,Ti、Fe、Ni、Cu、Zn元素的计算含量与标准含量接近,部分低含量元素受到散射本底等因素影响,含量误差较大。结果表明,该方法能够用于现场能量色散X射线荧光分析。

     

    Abstract: To analyze samples without using standard, the energy dispersive X-ray fluorescence analysis (EDXRFA) of unknown samples was studied. The ratio R of coherent and incoherent scattering peaks of Kα in the original spectrum of target Rh was got through the measurement of Ti, Fe, Ni, Cu, Zn, Sr, Sn, Pb single element standard samples, then the relationship between R and the effective atomic number of the corresponding single element standard samples was established, and the fitting curve of Zeff-R was obtained. When it comes to solve the unknown samples, measure the unknown samples and get the R, then the effective atomic number of the unknown samples was obtained by substituting the R of unknown samples into the Zeff-R fitting curve, and then the atomic number could be used in the fundamental parameters method iteration to calculate its mass attenuation coefficient. The Ti, Fe, Ni, Cu, Zn, Sr, Sn, Pb single element standard samples were again used to calibrate the instrument and obtain Gi parameter which was applied in the fundamental parameters method iteration of the corresponding element when it comes to solve the unknown samples. In order to verify the reliability of the algorithm, the 15 national soil standard samples were analyzed through the algorithm of this article. The results showed that the calculated content of Ti, Fe, Ni, Cu, Zn were close to the standard content, and some low content element’s content errors were a little larger because of the scattering background and other factors. The results showed that this algorithm could be used in the situ energy dispersive X-ray fluorescence analysis.

     

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