发射光谱法测定二氧化碲中的杂质元素

Determination of Eighteen Trace Impurities in Tellurium Oxide by Atomic Emission Spectrometry

摘要: ：采用发射光谱粉末法同时测定二氧化碲Pb、Mn、Ba、Sn、Fe、Co、Ti、Cd、Cr、Al、Ca、Si、B、Bi、V、Ni、Sb、Zn、Ag、Mg、Cu18个金属元素，选择石墨作载体，直接压样于石墨电极中，简单，快速而准确。其回收率在80%-120%范围内，相对标准偏差小于8%，用于样品的测定取得了满意的结果。

Abstract: :This paper describes the determination of the determination of trace Pb、Mn、Ba、Sn、Fe、Al、etc in tellurium oxide by atomic emission spectrometry（AES）。The sample was directly loaded into ordinary electrde。The method is simple，rapid and accurate。The range of the recovery is 83%-124%， and relative standard （RSD）is smaller than 8%。The method has been applied to the determination of the sample with satisfactory results。